Correlation Between Structure and Microwave Dielectric Properties of Low- Temperature-Fired Mg2SiO4 Ceramics

Yuanming Lai,Xiaoli Tang,Huaiwu Zhang,Xiaofeng Liang,Xin Huang,Yuanxun Li,Hua Su
DOI: https://doi.org/10.1016/j.materresbull.2017.11.036
IF: 5.6
2018-01-01
Materials Research Bulletin
Abstract:Mg2SiO4-LiF ceramics were fabricated via a conventional solid-state process and sintered at 900 degrees C. The secondary phase, Li2SiO3, was observed with <= 6 wt% LiF, and the Li2MgSiO4 phase was detected with >= 8 wt% LiF. The relative density and secondary phase can account for the decrease in the epsilon(r) with an increase in LiF. The degree of crystallization, unit cell volume, secondary phase, and microstructure correlated with the Q x f values. The value of the tau(f) was related to the distortions in the Mg(1)O-6 octahedron and the secondary phase. The sample exhibited excellent properties for Mg2SiO4-8.wt% LiF with epsilon(r) = 6.1, Q x f = 109719 GHz, and tau(f) = -61 ppm/degrees C. The temperature stability of the Mg2SiO4-8.wt%LiF-6 vol%CaTiO3 ceramics was obtained with epsilon(r) = 7.1, Q x f = 31091 GHz and tau(f) = - 2.0 ppm/degrees C. Mg2SiO4-LiF-CaTiO3 ceramics provide excellent chemical compatibility with Ag.
What problem does this paper attempt to address?