Atomic-scale Identification of Novel Planar Defect Phases in Heteroepitaxial YBa2Cu3O7−δ Thin Films

Nicolas Gauquelin,Hao Zhang,Guozhen Zhu,John Y. T. Wei,Gianluigi A. Botton
DOI: https://doi.org/10.1063/1.5011761
IF: 1.697
2018-01-01
AIP Advances
Abstract:We have discovered two novel types of planar defects that appear in heteroepitaxial YBa2Cu3O7−δ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La2/3Ca1/3MnO3 (LCMO) overlayer, using the combination of high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging and electron energy loss spectroscopy (EELS) mapping for unambiguous identification. These planar lattice defects are based on the intergrowth of either a BaO plane between two CuO chains or multiple Y-O layers between two CuO2 planes, resulting in non-stoichiometric layer sequences that could directly impact the high-Tc superconductivity.
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