A Method of Testability Optimization Based on BIT Working Mode Considering the Basic Reliability

Junyou Shi,Xuhao Guo,Wenzhe Li
DOI: https://doi.org/10.1109/phm.2017.8079175
2017-01-01
Abstract:Testability optimization is an important part of testability design. In the past, testability optimization design often neglects the correlation between testability and reliability and does not pay much attention to the influence of system reliability. Considering such circumstance, this paper studies the impact of the basic reliability of the system and the Built-In Test (BIT) working mode. Different optimization models for the testability design are established. A method of testability optimization based on BIT working mode considering the basic reliability is proposed. The fiber-optic inertia system is taken as an example to verify the method. The simulation proves the applicability and effectiveness.
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