Abstract:X-ray powder diffraction is an ideal technique for the quantitative analysis of a multiphase sample. The intensities of diffraction lines of a phase in a multiphase sample are proportional to the phase fraction and the quantitative analysis can be obtained if the correction for the absorption of X-rays in the sample is performed. Simple procedures of quantitative X-ray diffraction phase analysis of a multiphase sample are presented. The matrix-flushing method, with the application of reference intensities, yields the relationship between the intensity and phase fraction free from the absorption effect, thus, shunting calibration curves or internal standard procedures. Special attention is paid to the doping methods: (i) simultaneous determination of the fractions of several phases using a single doping and (ii) determination of the fraction of the dominant phase. The conditions to minimize systematic errors are discussed. The problem of overlapping of diffraction lines can be overcome by combining the doping method (i) and the individual profile fitting method, thus performing the quantitative phase analysis without the reference to structural models of particular phases. Recent suggestions in quantitative phase analysis are quoted, e.g., in study of the decomposition of supersaturated solid solutions—intermetallic alloys. Round Robin on Quantitative Phase Analysis, organized by the IUCr Commission on Powder Diffraction, is discussed shortly. The doping methods have been applied in various studies, e.g., phase transitions in titanium dioxide, biomineralization processes, and phases in intermetallic oxide systems and intermetallic alloys.

Effect of Testing Factors on Rietveld Quantitative Analysis of Cement-Matrix Materials

Quantitative Analysis of Phases for Cement-Based Materials by XRD-Rietveld Method

Quantitative Analysis of Cement-Based Materials and Sulfate Attack Products by XRD-Rietveld Analysis

Rietveld Quantitative Phase Analysis of Cemented Carbide Materials

Effects of Internal Standards and Peak Profile Functions on Quantitative XRD Phase Analysis of Cement and Its Hydrates

An Improved Quantification Method for Characterisation of Clay Microstructure Using SEM

X-Ray Quantitative Analysis of TiO2 Using Rietveld Whole Pattern Fitting Method

Quantitative Analysis of Crystal and Amorphous Phases in Clinker by QXRD/Rietveld Method

Quantitative Carbide Analysis Using the Rietveld Method for 2.25cr–1mo–0.25v Steel

Phase Analysis of Portland Cement by Combined Quantitative X-Ray Powder Diffraction and Scanning Electron Microscopy.

Quantitative Phase Analysis by the Rietveld Method for Forensic Science.

Comparison of Quantitative X-ray Diffraction Mineral Analysis Methods

The effect of data quality and model parameters on the quantitative phase analysis of X-ray diffraction data by the Rietveld method

Quantitative Analysis of a Textured Coating by a New X-Ray Diffraction Method

Phase quantification of anhydrous CSA cements: a combined X-ray diffraction and Raman imaging approach

Quantitative analysis of zirconia powder by rietveld method of X-ray diffraction

Quantitative Characterization of Hydration of Cement Pastes by Rietveld Phase Analysis and Thermoanalysis

Quantitative X-ray Rietveld Analysis of Metallic Aluminum Content in Nano-Aluminum Powders

Rietveld Quantitative Analysis of Carbides Precipitation in Normalized-Tempered 2.25Cr-1Mo-0.25v Steel

Quantitative Phase Analysis by X-ray Diffraction—Doping Methods and Applications

Quantitative Phase Analysis In The Ti-Al-C Ternary System By X-Ray Diffraction