Domain Growth Dynamics in (K, Na)NbO3 Ferroelectric Thin Films

Tian-Lu Men,Hao Cheng Thong,Jun-Tao Li,Mo Li,Jian Zhang,Vicki Zhong,Jin Luo,Xiangcheng Chu,Ke Wang,Jing-Feng Li
DOI: https://doi.org/10.1016/j.ceramint.2017.03.180
IF: 5.532
2017-01-01
Ceramics International
Abstract:(K,Na)NbO3 (KNN) based lead-free materials have gained great progress and drawn much attention recently, due to their attractive piezoelectric performance and the demand for environmental protection. As is known, domain motion is essential for piezoelectric output; however, there is limited understanding on this topic for KNN. In the present study, the domain growth process of the KNN thin film is studied by piezoresponse force microscopy (PFM). The domain size shows a linear dependence on the pulse voltage and a complex dependence, unlike the commonly accepted logarithmic relationship, on the pulse duration. Meanwhile, a power decay relationship between the domain wall velocity and the domain size is observed. The extremely low dynamical exponent proves that our sample is influenced by extremely strong pinning effects caused by defects, resulting in the uncommon pulse duration dependence of domain size.
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