Identifying a Doping Type of Semiconductor Nanowires by Photoassisted Kelvin Probe Force Microscopy As Exemplified for GaN Nanowires

Xiaoxiao Sun,Xinqiang Wang,Ping Wang,Bowen Sheng,Mo Li,Juan Su,Jian Zhang,Fang Liu,Xin Rong,Fujun Xu,Xuelin Yang,Zhixin Qin,Weikun Ge,Bo Shen
DOI: https://doi.org/10.1364/ome.7.000904
2017-01-01
Optical Materials Express
Abstract:It remains a challenge to characterize the doping type in nanowires (NWs). We report in this paper a novel way to probe the doping type in GaN NWs by photoassisted kelvin probe force microscopy (KPFM), as a proper example showing that this approach is straight forward, effective and practical. Through illumination with super-bandgap light, photo-generated electrons in the n-region are swept away from the surface due to the electric field in the space-charge region, thus the holes move to the surface; while in contrast, electrons in the p-region will move to the surface. The fact that the quasi-Fermi level moves upwards in n-type while downwards in p-type identifies the doping type of GaN NWs, and is clearly revealed by the contact potential difference detected by photoassisted KPFM. (C) 2017 Optical Society of America
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