Leakage Current Induced by Energetic Disorder in Organic Bulk Heterojunction Solar Cells: Comprehending the Ultrahigh Loss of Open-Circuit Voltage at Low Temperatures

Wenchao Yang,Yongsong Luo,Pengfei Guo,Haibin Sun,Yao

DOI: https://doi.org/10.1103/physrevapplied.7.044017

IF: 4.6

2017-01-01

Physical Review Applied

Abstract:The open-circuit voltage (V-oc) of organic solar cells generally approaches its maximum obtainable values as the temperature decreases. However, recent experiments have revealed that the V-oc may suffer from an ultrahigh loss at low temperatures. In order to verify this explanation and investigate the impacts of energetic disorder on the temperature-dependent behaviors of the V-oc in general, we calculate the V-oc-T plots with the drift-diffusion method under various device working parameters. With the disorder being incorporated into the device model by considering the disorder-suppressed (temperature-dependent) charge-carrier mobilities, it is found that the ultrahigh V-oc losses cannot be reproduced under the OnsagerBraun-type charge generation rate. With the charge generation rate being constant or weakly dependent on temperature, for nonselective contacts, the V-oc reduces drastically at low temperatures, while for selective contacts, the V-oc increases monotonically with decreasing temperature. With higher carrier mobilities or smaller device thicknesses, the ultrahigh loss occurs at lower temperatures. The mechanism is that, since the disorder- suppressed charge mobilities give rise to both low charge-extraction efficiency and small bimolecular recombination rate, plenty of charge carriers can be extracted from the wrong electrode and can form a large leakage current, which counteracts the majority-carrier current and reduces the V-oc at low temperatures. Our results thus highlight the essential role of charge-carrier kinetics, except for the charge-filling effect, on dominating the disorder- induced V-oc losses.