Abstract:Potential‐induced degradation‐polarization (PID‐p) can reduce module power, but how to project the extent to which PID‐p may occur in field conditions considering the factors of system voltage, condensed moisture, temperature, and illumination has not been clarified. Using tunnel oxide passivated contact (TOPCon) modules, this work demonstrates a method to test full‐size crystalline silicon PV modules for PID‐p to provide field‐representative results. In initial screening tests with positive or negative 1000 V electrical bias applied at 60°C for 96 h using Al foil electrodes on the glass surfaces, the module type exhibited reversible PID‐p only on the front face when the cell circuit was in negative voltage potential. No PID was detected on the rear after testing in either polarity. We then evaluated the PID‐p sensitivity on the front side under different UV irradiances while maintaining the glass surface wet to estimate real‐world susceptibility to PID‐p. The magnitude of the observed behavior was fit using a previously developed charge transfer and depletion by light model. Whereas power loss with −1000 V applied to the cell circuit at 60°C for 96 h in the dark was about 30%, testing the module front under 0.051 W·m−2 nm−1 at 340 nm UVA irradiation using fluorescent tubes, the mean degradation was only 3%. When the modules were tested in the dark for PID‐p with in situ dark current–voltage (I‐V) characterization, the thermal activation energy for degradation was 0.71 eV; for recovery in the dark, it was 0.58 eV. Whereas recovery from the degraded state at 60°C in the dark without voltage bias was 5% absolute in 38 h, rapid recovery of about 5% absolute was observed with 1000 W·s/m2 exposure at 25°C using a flash tester.

The Real Situation of Potential-Induced Degradation in Multicrystalline Silicon Photovoltaic Power Plant

Investigation on Potential-Induced Degradation in a 50mwp Crystalline Silicon Photovoltaic Power Plant

Regular and Irregular Performance Variation of Module String and Occurred Conditions for Potential Induced Degradation-Affected Crystalline Silicon Photovoltaic Power Plants

Similarity of potential-induced degradation in superstrate-type thin-film CdTe and Si photovoltaic modules

Hotspots and Performance Evaluation of Crystalline-Silicon and Thin-Film Photovoltaic Modules

Electro-analytical investigation of potential induced degradation in mc-silicon solar cells: case of sodium ion induced inductive loop

Field‐representative evaluation of PID‐polarization in TOPCon PV modules by accelerated stress testing

Impact of partial shading on the performance and reliability of potential-induced degraded crystalline silicon PV module

Acceleration of potential-induced degradation in crystalline Si photovoltaic modules after a lightning impulse strike

Potential Induced Degradation in Photovoltaic Modules: A Review of the Latest Research and Developments

Method to Study PID of Perovskite Solar Cells and Modules in an Inert Environment

Identifying PV Module Mismatch Faults by a Thermography-Based Temperature Distribution Analysis

Investigation of Potential‐Induced Degradation and Recovery in Perovskite Minimodules

Impact Analysis of Potential Induced Degradation on Crystalline Silicon Solar Cell Performance by Correlating Practical Diagnosis with MATLAB Simulation

Potential-induced degradation of encapsulant-less p-type crystalline Si photovoltaic modules

Characterization of rear-side potential-induced degradation in bifacial p-PERC solar modules

Investigation of the Potential-Induced Aging Phenomenon of an Insulating Encapsulant for a Photovoltaic Module: From Electrical to Chemical Properties

Suppression of potential-induced degradation in monofacial PERC solar cells with gradient-designed capping layer

A Novel Methodology for Partial Shading Diagnosis Using the Electrical Parameters of Photovoltaic Strings

In-Situ Measurement of Power Loss for Crystalline Silicon Modules Undergoing Thermal Cycling and Mechanical Loading Stress Testing

A Fast MPPT-based Anomaly Detection and Accurate Fault Diagnosis Technique for PV Arrays