Ellipsometric study on temperature dependent optical properties of topological bismuth film

Liao Yang,Yu-Xiang Zheng,Shang-Dong Yang,Zhun-Hua Liu,Jin-Bo Zhang,Rong-Jun Zhang,Song-You Wang,Dong-Xu Zhang,Liang-Yao Chen
DOI: https://doi.org/10.1016/j.apsusc.2016.11.006
IF: 6.7
2017-01-01
Applied Surface Science
Abstract:•The results given by spectroscopic ellipsometry show that both band gap and free electron density in the Bi film increase with rising temperature, suggesting the Bi film of topological properties.•The free electron density of liquid Bi is 104 times higher than that of solid Bi, and the differences between their optical properties are also obviously observed.•Spectroscopic ellipsometry is proved to be a useful method to characterize topological insulators.
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