Double random sources: low-cost method to enhance local optima escaping ability in CMOS-type Ising chips

Jian Zhang,Shuming Chen,Chao Yang,Yaohua Wang
DOI: https://doi.org/10.1049/el.2016.2218
2016-01-01
Electronics Letters
Abstract:The local optima escaping ability, which is critical for both accuracy and efficiency of CMOS-type Ising chips, is greatly affected by the probability to accept a worse state. Theoretically, such probability is determined by both energy barriers and temperature. However, due to the implementation complexity, the energy barrier is not considered in existing CMOS-type Ising chips. We propose a doubl...
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