Elemental X-Ray Imaging Using Zernike Phase Contrast

Qi-Gang Shao,Jian Chen,Faiz Wali,Yuan Bao,Zhi-Li Wang,Pei-Ping Zhu,Yang-Chao Tian,Kun Gao
DOI: https://doi.org/10.1088/1674-1056/25/10/108702
2016-01-01
Abstract:We develop an element-specific x-ray microscopy method by using Zernike phase contrast imaging near absorption edges, where a real part of refractive index changes abruptly. In this method two phase contrast images are subtracted to obtain the target element: one is at the absorption edge of the target element and the other is near the absorption edge. The x-ray exposure required by this method is expected to be significantly lower than that of conventional absorption-based x-ray elemental imaging methods. Numerical calculations confirm the advantages of this highly efficient imaging method.
What problem does this paper attempt to address?