X-ray Phase Contrast Imaging Using a Micro-Focused Electron Source

Chang Shengcheng,Zhu Zhuoya,Lei Wei,Zhang Xiaobing,Li Yuan,Yang Hua
DOI: https://doi.org/10.1109/ivnc.2016.7551481
2016-01-01
Abstract:X-ray phase contrast imaging (XPCI) can improve the contrast of light material object and has potential application in conventional radiography. The influence of the focus spot size of the X-ray source on the performance of the XPCI is studied in the vacuum chamber of scanning electronic microscopy (SEM), and the effect of the incident angle of electronic beam and anode materials are also studied.
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