CMOS Wireless Stress Sensor IC with 256-Cell Sensing Array for Ultra-Thin Applications

Hanjun Jiang,Zheyao Wang,Shujie Yang,Heng Liu,Zhihua Wang
DOI: https://doi.org/10.1049/el.2016.2622
2016-01-01
Electronics Letters
Abstract:A wireless stress sensor integrated circuit (IC) has been implemented in 0.18 μm CMOS technology. The IC is composed of a 256-cell stress sensing array, the current-based sensor readout circuit, a 12 bit successive approximation (SAR) ADC and a 432 MHz wireless transmitter. The stress sensor employs orthogonally placed current source pair to measure the normal and shear stresses. The chip is backlapped to 35 μm for ultra-thin applications such as human skin stress distribution measurement. The measured sensing nonlinearity is below 0.7%. Experiments show that the implemented IC can be used to detect the facial expression changes.
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