Gate-Variable Mid-Infrared Optical Transitions in an Electronic Topological Insulator

William S. Whitney,Victor W. Brar,Yunbo Ou,Artur R. Davoyan,Ke He,Qi-Kun Xue,Harry A. Atwater
2016-01-01
Abstract:We report the first mid-infrared spectroscopy measurement of an electrostatically gated topological insulator, in which we observe several percent modulation of transmittance and reflectance of (Bi1-xSbx)2Te3 films as gating shifts the Fermi level. We combine these optical experiments with transport measurements and ARPES to identify the observed spectral modulation as a combination of gate-variable Pauli-blocking of bulk interband optical transitions at higher energies and modulation of intraband transitions associated with the varying topological surface state (TSS) and bulk free carrier densities at lower energies. We model these phenomena and find a good match to our experimental data. To allow these gated transmittance measurements, a novel epitaxial lift-off method is developed for large-area transfer of TI films from infrared absorbing SrTiO3 growth substrates to thermal oxide on silicon. These results present layered topological insulator materials as a new candidate for tunable infrared optics and demonstrate the possibility of extending the tunable, mid-infrared Dirac plasmons seen in graphene to spin-polarized topological insulator systems.
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