ULTRASONIC NONDESTRUCTIVE THICKNESS MEASUREMENT FOR THIN LAYLERS

徐志辉,林莉,李喜孟,谭家隆

DOI: https://doi.org/10.3969/j.issn.1001-4012.2004.08.009

2004-01-01

Abstract:Four methods of ultrasonic thickness measurement: pulse-echo, time domain reflection field analysis, Lamb waves, surface waves, for thin layers have been introduced. The principles have been explained, and their different advantages and applied conditions have been reviewed.

What problem does this paper attempt to address?

Simultaneously Measuring Thickness, Density, Velocity and Attenuation of Thin Layers Using V(z,t) Data from Time-Resolved Acoustic Microscopy.

Jian Chen,Xiaolong Bai,Keji Yang,Bing-Feng Ju

DOI: https://doi.org/10.1016/j.ultras.2014.09.019

IF: 4.2

2015-01-01

Ultrasonics

Abstract:To meet the need of efficient, comprehensive and automatic characterization of the properties of thin layers, a nondestructive method using ultrasonic testing to simultaneously measure thickness, density, sound velocity and attenuation through V(z,t) data, recorded by time-resolved acoustic microscopy is proposed. The theoretical reflection spectrum of the thin layer at normal incidence is established as a function of three dimensionless parameters. The measured reflection spectrum R(θ,ω) is obtained from V(z,t) data and the measured thickness is derived from the signals when the lens is focused on the front and back surface of the thin layer, which are picked up from the V(z,t) data. The density, sound velocity and attenuation are then determined by the measured thickness and inverse algorithm utilizing least squares method to fit the theoretical and measured reflection spectrum at normal incidence. It has the capability of simultaneously measuring thickness, density, sound velocity and attenuation of thin layer in a single V(z,t) acquisition. An example is given for a thin plate immersed in water and the results are satisfactory. The method greatly simplifies the measurement apparatus and procedures, which improves the efficiency and automation for simultaneous measurement of basic mechanical and geometrical properties of thin layers.
Simultaneous Thickness, Velocity, Density, and Attenuation Measurement of a Thin Layer by Time-Resolved Acoustic Microscopy

Jian Chen,Xiaolong Bai,Keji Yang,Bingfeng Ju,Jianxing Meng

DOI: https://doi.org/10.1121/1.4755238

2012-01-01

The Journal of the Acoustical Society of America

Abstract:An ultrasonic method for simultaneous determination of thickness, velocity, density and attenuation of thin layer using a time-resolved acoustic microscopy is proposed. Reflection from the thin layer is represented as a function of three dimensionless parameters which are determined from the experimentally normal incidence component of the two dimensional reflection spectrum R(θ,ω) derived based on the inversion of V(z,t) technique with time-resolved acoustic microscopy. The thickness of the thin layer is derived from the signals received from the layer itself considering the geometrical relations when the lens focused on the sample’s surfaces. The simultaneous determination of thickness, velocity, density and attenuation of thin stainless steel plate by using a point-focusing transducer with nominal frequency of around 50MHz were carried out. The determined material properties are comparable, in which the thickness, velocity and density can be measured with a percentage biases less than 5% and the attenuation is close to its real value. The present preliminary work shows the high efficiency, viability and capability of the new non-destructive technique in simultaneously characterize basic mechanical and geometrical properties of thin layers.
A Novel Laser Ultrasonic Thickness Measurement Method for Metal Plate Based on Spectral Analysis

Yongqiang Liu,Shixi Yang,Chunbiao Gan

DOI: https://doi.org/10.1109/urai.2015.7358964

2015-01-01

Abstract:Thickness measurement is highly useful in industrials both for controlling the thickness of the product and for material characterization considering both mechanical and chemical properties. Longitudinal ultrasonic velocity can be used to measure material thickness provided that sufficient accuracy can be achieved. A new laser ultrasonic thickness measurement method based on spectral analysis was proposed in this paper and was used for accurate thickness measurement for metal plate. A one-layer model was introduced which laser ultrasonic transmits into, deducing the expression of ultrasonic reflection coefficient amplitude spectrum (URCAS), from which we obtained the method for metal plate thickness measurement; then a laser ultrasonic system was set up to receive the laser ultrasonic transmitting into the plate. Meanwhile we developed a new laser ultrasonic data processing algorithm so that the frequency values of the peaks in frequency domain could be easily identified, then the velocity of the longitudinal ultrasonic could be calculated by the frequency difference of two adjacent peaks; finally, based on the velocity of the longitudinal ultrasonic and the experiment data the thickness of the metal plate could be calculated by inversion algorithm. The relative errors of the thickness measurement were below 0.66% for 5052 aluminum alloy; also we found that, the measurement of thickness is more accurate as the alloy thickness decreases.
Simultaneous Measurement of Elastic Moduli, Attenuation, Density, and Thickness of a Layer by Ultrasonic Spectroscopy Using Point-Focus Transducer

Xiaolong Bai,Jian Chen,Bing-feng Ju,Keji Yang

DOI: https://doi.org/10.1109/ultsym.2012.0181

2012-01-01

Abstract:This paper presents an ultrasonic technique for simultaneous determination of the complete set of acoustical and geometrical properties of a layer embedded between two known materials using point-focus transducer, which provides a high lateral resolution. The theoretical model of the two-dimensional spectrum Rt(θ,ω) of the layer is calculated as a function of six parameters: longitudinal and transverse velocities ci, ct, attenuation αi, αt, density ρ and thickness h, which fully determined the layer properties. The experimental spectrum Re(θ,ω) can be measured by V(z,t) technique using point-focus transducer which is verified in our previous work. By minimizing the differences between the theoretical and experimental spectra at normal and oblique incidence, the six parameters of the layer can be derived. The full set of the properties of a 250μm thick stainless steel layer immersed in water are determined using this technique as an example. This measurement technique enables precise measuring of the local full set properties of layers.
THE COMPARISON OF LONGITUDAL PULSE-ECHO AND LAMB WAVES IN THE APPLICATION OF THIN-LAYERED STRUCTURE CHARACTERIZATION

LI Ji-cheng,LIN Li,LI Xi-meng

DOI: https://doi.org/10.3969/j.issn.1001-4012.2006.10.008

2006-01-01

Abstract:This paper introduces two methods of ultrasonic characterization of thin layers: longitudinal pulse-echo and Lamb waves.The principles have been explained,their advantages and applied conditions have been compared.The application of longitudinal pulse-echo is relatively simple, which can provide information of the thin layers such as the depth,ultrasonic velocity,attenuation etc.The disadvantage of this method is that the attenuation in the layered media and the surface roughness affect the experimental results greatly,the ultrasonic probe should have good performance.Lamb waves method is mainly used to characterize thin plate materials,without using very high frequency,it can measure the velocity of transverse wave and longitudinal wave,depth of the plate,and the bonding quality between plates.Lamb waves method is relatively accurate,however,the experimental results may be influenced by many factors,for example,the distance and oblique angle of the transmitting and receiving probe should be carefully controlled.
A Novel Technique for the Measurement of the Acoustic Properties of a Thin Linear-Viscoelastic Layer Using a Planar Ultrasonic Transducer

Xiaolong Bai,Zeqing Sun,Jian Chen,Bing-Feng Ju

DOI: https://doi.org/10.1088/0957-0233/24/12/125602

2013-01-01

Abstract:Thin linear-viscoelastic layers such as films and coatings have many applications. Simultaneous measurement of the multiple acoustic properties of a thin layer is of great importance in ensuring its quality. In this paper, a novel technique is proposed for the simultaneous determination of the three acoustic properties of a thin linear-viscoelastic layer, namely the acoustic impedance Z(2), the time-of-flight Delta t(2) and the attenuation coefficient alpha(2). A planar ultrasonic transducer, at normal incidence, is used to interrogate the thin layer, and all the reflections are received by the same transducer. Firstly, an optimal estimate of Z2 is obtained by subtracting the echo from the front surface of the thin layer from all the received echoes. After this determination of the acoustic impedance, optimal estimates for Delta t(2) and alpha(2) can be found if the echo from the back surface of the thin layer is subtracted without any remainder. This technique avoids the convergence problem that is frequently encountered in the traditional measurement techniques based mainly on fitting the experimental reflection spectrum to a theoretical model. The effectiveness of the new technique is firstly confirmed by numerical simulation and then by experimental application to four thin linear-viscoelastic layers. Experimental results show that Z2 and Delta t(2) can be obtained accurately while the error in determining of alpha(2) is relatively
An ultrasonic methodology for determining the mechanical and geometrical properties of a thin layer using a deconvolution technique.

Jian Chen,Xiaolong Bai,Keji Yang,Bing-Feng Ju

DOI: https://doi.org/10.1016/j.ultras.2013.04.006

IF: 4.2

2013-01-01

Ultrasonics

Abstract:•Thin layer’s thickness, density, sound velocity, attenuation simultaneous measuring.•Investigated dimensionless parameters convergence zones by inverse algorithm.•Obtained normal reflection spectrum, thickness, initialization of inverse algorithm.
Determination of the Multiple Local Properties of Thin Layer with High Lateral Resolution by Scanning Acoustic Microscopy.

Xiaolong Bai,Zeqing Sun,Anyu Sun,Jian Chen,Bing-Feng Ju

DOI: https://doi.org/10.1063/1.4894261

2014-01-01

Abstract:Simultaneous determination of the multiple local acoustic and geometrical properties of the thin layer with a high lateral resolution is of great interest in ultrasonic non-destructive evaluation. In this paper, we propose a technique based on the V(z, t) data to simultaneously determine the four local properties of the thin layer, namely, the thickness, the sound velocity, the acoustic impedance, and the density. First, the V(z, t) data are collected from both the thin layer and the reference material. Then the sound velocity and the thickness are calculated by focusing the point-focusing transducer on the front and back surfaces of the thin layer, with the confocal positions determined by averaging the peak positions in the V(z) curves at different frequencies. Second, the acoustic impedance of the thin layer is obtained based on the experimental and theoretical two-dimensional reflection spectrum using the echo from the front surface of the layer. Finally, the density can be obtained by dividing the acoustic impedance by the sound velocity. The four local properties of an aluminum layer are accurately obtained using our method. The largest relative error of determining the four properties is around 1%. This technique opens a new way of simultaneously measuring the multiple local acoustic and geometrical properties of thin layers.
Simultaneous Measurement of Local Longitudinal and Transverse Wave Velocities, Attenuation, Density, and Thickness of Films by Using Point-Focus Ultrasonic Spectroscopy

Bing-Feng Ju,Xiaolong Bai,Jian Chen

DOI: https://doi.org/10.1063/1.4758136

IF: 2.877

2012-01-01

Journal of Applied Physics

Abstract:This paper presented an ultrasonic technique for simultaneous determination of the complete set of acoustical and geometrical properties of a layer embedded between two known materials using point-focus ultrasonic spectroscopy, which provides a high lateral resolution. The theoretical model of the two-dimensional spectrum Rt (θ, ω) of the layer is calculated as a function of six parameters of longitudinal and transverse velocities cl, ct, attenuation αl, αt, density ρ and thickness h, which fully determined the layer properties. The experimental spectrum Re (θ, ω) can be measured by V(z, t) technique. A two-step algorithm is presented to decompose the searching process of parameters from one six-dimensional to two three dimensional spaces. The sensitivity of the two-dimensional spectrum to individual properties and its stability against experimental noise are studied. The full set properties of a 250 μm thick stainless steel plate immersed in water are determined. The proposed technique used a point focus transducer, which makes the set-up simple and reliable. It allows measurement of the local properties of the layer and enables precision material characterization.
The Method of Ultrasonic Thickness Measurement for Surface Coatings Materials Based on Spectral Analysis

徐志辉,林莉,李喜孟,雷明凯

DOI: https://doi.org/10.3321/j.issn:1007-9289.2004.06.002

2004-01-01

China surface engineering

Abstract:The signal processing method of ultrasonic thickness measurement has been investigated for the film or coating materials less than 1mm. When ultrasonic waves are reflected at different interfaces, they interfere with each other. Provided there is a medium with thickness L, sound velocityν, acoustic impedance Z2 between two mediums with acoustic impedances Z1 and Z3, and depending on the interference of echoes from different interfaces, the interference phenomena is observed in power spectrum: the periodic extremums appear at frequencies of odd or integral multiples of the fundamental frequency f0 equal toν/4L. So, when the value ofνis known, the medium thickness L can be calculated by relation L=ν/2△f, where △f is intervalbetween periodic extremums frequencies. Based on this principle, pulsed-echo method was used to test the thickness of sprayed ZrO2 coatings (270~400 μm) on Ni-based superalloy by spectral analysis technique, the experimental results accorded with those of cross-section measurement.
Simulation of Layer Thickness Measurement in Thin Multi-Layered Material by Variable-Focus Laser Ultrasonic Testing

Jinxing Qiu,Zhengying Li,Cuixiang Pei,Guoqiang Luo

DOI: https://doi.org/10.3390/s23020694

IF: 3.9

2023-01-08

Sensors

Abstract:Thin multi-layered materials are widely used in key structures of many high technology industries. To ensure the quality and safety of structures, layer thickness measurement by non-destructive testing (NDT) techniques is essential. In this paper, a novel approach for the measurement of each layer's thickness in thin multi-layered material is proposed by using ring-shaped laser generated focused ultrasonic bulk waves. The proposed method uses a ring-shaped laser with a variable radius to generate shear waves with variable focus inside the structure. By analyzing the signal characteristics at the ring center when the laser radius varies from zero to maximum, the direct measurement of layer thickness can be realized, considering that only when the focal depth and the layer thickness satisfy the specific relationship, the reflected shear waves converge and form a peak at the ring center. This straightforward approach can increase the pulse-echo SNR and prevent the processing of aliasing signals, and therefore provides higher efficiency and accuracy for the layer thickness measurement. In order to investigate the feasibility of this method, finite element simulations were conducted to simulate the ring-shaped laser generated ultrasonic waves in multi-layered structure in detail. Following the principle of the proposed method, the layer thickness of a bi-layer and 3-layer structure were respectively measured using simulation data. The results confirm that the proposed method can accurately and efficiently measure the layer thickness of thin multi-layered material.

engineering, electrical & electronic,chemistry, analytical,instruments & instrumentation
A Phase Spectrum Method For The Measurement Of Liquid-Layer Thickness

Quanchang Li,Junkai Ding,Wenbin Huang

DOI: https://doi.org/10.1115/imece2018-87201

2019-01-01

Abstract:Ultrasonic technology has been widely used to measure the thickness of lubricant film. The time delay between multiple reflections reflects the thickness of the liquid layer. As the thickness of liquid layer decreases, the measurement becomes more difficult owing to the overlapping of waveforms. Unlike the mainstream methods focusing on the characteristics of amplitude, a phase spectrum method is proposed in this paper to determine the thickness, which is much easier to operate and doesn't need any extra noise reduction. It provides another point of view to solve the problem of film thickness measurement. This algorithm has been verified to test the liquid layer thickness ranging of 10-200 mu m in a self-made experimental platform. Experimental results show that the thickness can be obtained accurately and the error is within the allowable range.
Theoretical research on thickness measurement of fluid layer in mechanical structure by using ultrasonic technique

JIAO Jing-pin,ZHANG Qiang,WU Bin,HE Cun-fu

DOI: https://doi.org/10.3969/j.issn1000-3630.2009.03.009

2009-01-01

Abstract:For the necessity of monitoring mechanical structure operation,the thickness measurement of thin fluid layer in mechanical structure by using ultrasonic technique is theoretically studied.A model of three layers of media is constructed to simulate the propagation of normal incidence ultrasound.Considered the continuous boundary conditions,the reflection coefficient of thin fluid layer to normal incidence longitudinal waves is obtained from the continuous model.By study the reflection coefficients of different thicknesses of fluid layers,two models,resonant model and spring model,are developed to characterize the thickness of fluid layer respectively by the resonant frequency and stiffness coefficient.Meanwhile,the influence of acoustic properties of three layers on the reflection coefficient and the measurement of thickness is studied.
Multi-mode Ultrasonic Waves Focusing in a Variable Focus Technique for Simultaneous Sound-Velocity and Thickness Measurement

Xiaoyu Yang,Chuanyong Wang,Anyu Sun,Bing-feng Ju

DOI: https://doi.org/10.1016/j.apacoust.2019.107090

IF: 3.614

2020-01-01

Applied Acoustics

Abstract:A double-focus technique, using a spherically focused immersion transducer, has been developed for simultaneous sound-velocity and thickness measurement. This is an effective method that does not require pre-experiments or predictive parameters. In previous studies, the single-mode wave model, usually used, cannot explain the additional reflection peaks on the V(z, t) curve, which denote two-dimensional amplitudes as a function of the movement along distance z and the time t. In this research, a multi-mode wave model, interpreting the results of depth scanning of thin solid plates, using a spherically focused ultrasound transducer in pulse-echo mode, is presented. The existence of additional reflection peaks in the solid plate due to mode conversion, which are usually neglected, are described in the new model. A comprehensive interpretation of the measurements is proposed, instead of ignoring the transverse waves and mode conversion. The distribution of energy among multiple reflected focuses and the vertical displacements of the transducer are numerically analysed. The experiments on a 0.5 mm thick stainless steel and a 0.5 mm thick aluminium alloy have been carried out to verify the model. This study contributes to the identification of longitudinal-wave focuses, especially in cases of simultaneous measurement on multi-layered materials. (C) 2019 Elsevier Ltd. All rights reserved.
ULTRASONIC SIGNAL-PROCESSING CONCEPTS FOR MEASURING THE THICKNESS OF THIN LAYERS

P. Meyer,J. Rose

1974-12-01

Abstract:A systematic approach is presented for developing ultrasonic signal-processing procedures that can be used to measure the thickness of thin layers. Such preprocessing procedures as time between echoes, peak-to-peak amplitude analysis, and Fourier Transform techniques are considered in the paper. The work can be extended to such areas of study as the property evaluation of thin planar defects in metals, flaw characterization analysis in an adhasively bonded system, and also applied to the fatigue crack analysis problem, including an evaluation of possible corrosion and sealer properties in the thin layer. /Author/

Physics,Engineering,Materials Science
Parameter Measurement of Thin Elastic Layers Using Low-Frequency Multi-Mode Ultrasonic Lamb Waves

R Zhang,MX Wan,WW Cao

DOI: https://doi.org/10.1109/19.963216

IF: 5.6

2001-01-01

IEEE Transactions on Instrumentation and Measurement

Abstract:A low-frequency ultrasonic method presented in this paper is suitable for measuring any one of the four characteristic parameters, i.e., thickness, density, shear, and longitudinal wave velocities, of a thin elastic layer given the remaining three. Thickness of the thin layer is much smaller than the longitudinal wavelength of the ultrasonic wave used in the experiments. The method employs the water immersion pitch-catch technique, and is based on the dispersion properties of the first-order symmetric and anti-symmetric modes of a Lamb waveguide. The unknown parameter is estimated by minimizing the mean square error obtained by comparing theoretical dispersion curves with experimental data. A wide-band excitation technique is used to reduce measurement time, by which a frequency range of possible guided Lamb waves is simultaneously explored. The sensitivity and accuracy of the proposed technique for different parameters in different thicknesses are analyzed. Using the present technique, a thin layer with thickness down to one percent of the longitudinal wavelength can be successfully measured with an average error of about two-percent. But the method fails to evaluate the density of the thin layer if the thickness is less than five percent of longitudinal wavelength.
Thickness Measurement of Liquid Layer in Mechanical Structure Using Ultrasonic Resonant Technique

Jiao Jingpin,Zhang Qiang,He Cunfu,Wu Bin

DOI: https://doi.org/10.3969/j.issn.1004-6801.2012.02.023

2012-01-01

Abstract:Aiming at the need of the safe operation of mechanical structure,an effective method to measure the thickness of lubrication film using ultrasonic resonant technique is developed.A model of three layers is constructed to simulate the propagation of normal incidence ultrasound.By the analysis of reflection coefficient of lubrication film with different thicknesses,the resonant frequency of reflection coefficient is used to characterize the thickness of lubrication film.After the calibration of experimental system,the experiment of lubrication film thickness measurement is conducted using ultrasonic resonant method.It is shown that the measurement results agree well with that of the actual condition.Meanwhile,the influences of acoustic properties of three layers on the reflection coefficient and measurement of thickness are studied.The results show that the thickness of lubrication film can be characterized by the resonant frequency of reflection coefficient.The error of measurement remains less than 5% on the basis of the calibration of experimental system.It has little or no effect on the measurement when both sides of lubrication film are changed.However,the measurement system needs to be calibrated before changing the material of lubrication film.
Ultrasonic Thickness Measurement Method and System Implementation Based on Sampling Reconstruction and Phase Feature Extraction

Wenqiang Gong,Xuanze Wang,Zhenyu Yang,Zhongsheng Zhai,Wei Feng,Da Liu

DOI: https://doi.org/10.3390/s23229072

2023-11-09

Abstract:The existing ultrasonic thickness measurement systems require high sampling frequencies for echo signal acquisition, leading to complex circuit designs and high costs. Moreover, extracting the characteristics of ultrasonic echo signals for accurate thickness measurement poses significant challenges. To address these issues, this paper proposes a method that utilizes conventional sampling frequencies to acquire high-frequency ultrasonic echo signals, overcoming the limitations of high-frequency data acquisition imposed by the Nyquist-Shannon sampling theorem. By employing an improved sampling reconstruction technique, the multi-cycle sampling signals are reconstructed and rearranged within a single cycle, effectively increasing the equivalent sampling frequency. Additionally, a combination of coarse estimation using fast Fourier transform (FFT) and precise phase extraction using the moving sine fitting algorithm is proposed for accurate thickness measurement, resolving the limitations of common thickness measurement methods such as peak detection, envelope detection, and Hilbert autocorrelation in terms of low measurement accuracy. Experimental results obtained from thickness measurements on 45 steel ultrasonic test blocks within the range of 3 mm to 20 mm indicate a measurement error of ±0.01 mm, while for thicknesses ranging from 1 mm to 50 mm, the measurement error is ±0.05 mm.
A New Method for Measuring Multilayer Thickness Using a Chromatic Confocal Sensor

Tiancheng Liu,Yutong Hong,Jiajun Wu,Wule Zhu,Bingfeng Ju

DOI: https://doi.org/10.1007/s41871-024-00241-w

2024-01-01

Nanomanufacturing and Metrology

Abstract:Multilayer transparent plates play a crucial role in industrial fields, such as optical lenses, electrodes, and solar panels, because of their superior optical and electrical properties. The thickness and uniformity of such plates are decisive for the quality of the final product. However, traditional contact measurement methods are inadequate in accuracy and pose the risk of damaging the plates, making nondestructive measurement of multilayer transparent plate thickness rather challenging. A new measurement technology is urgently needed. This study proposes a new method for the thickness measurement of multilayer transparent plates based on chromatic confocal sensor technology. First, we investigated the dispersive behavior of light in various media layers and derived theoretical measurement models for single-layer and multilayer transparent plate thicknesses. Subsequently, we designed and constructed a measurement system using a C-series chromatic confocal sensor and optical instruments and prepared a five-layer transparent sample consisting of quartz and air layers to confirm the feasibility of the method. The results of the experiment show that the proposed method can accurately measure the thickness of the five-layer sample with a maximum absolute error within 13 µm and a maximum relative error of 4.27
Comparative Research on Ultrasonic and THz Methods for Thickness Measurement of Thermal Barrier Coatings

Zhiming Huang,Binghua Cao,Mengbao Fan,Fengshan Sun,Bo Ye

DOI: https://doi.org/10.21203/rs.3.rs-3774807/v1

2023-01-01

Abstract:The thickness evaluation of thermal barrier coatings has emerged as a crucial issue, with ultrasonic testing (UT) and THz testing being the two dominant non-destructive evaluation methods. Focusing on thermal barrier coatings, this paper compares the thickness measurement results obtained from these two methods. When compared to the results obtained from a profilometer, the maximum error in ultrasonic thickness measurement is found to be 6.7%, while the maximum error in THz thickness measurement is 5.8%. The paper also discusses the primary advantages and disadvantages of the existing methods, concluding that both approaches can enhance the lifespan and safety of turbine blades.

ULTRASONIC NONDESTRUCTIVE THICKNESS MEASUREMENT FOR THIN LAYLERS

Simultaneously Measuring Thickness, Density, Velocity and Attenuation of Thin Layers Using V(z,t) Data from Time-Resolved Acoustic Microscopy.

Simultaneous Thickness, Velocity, Density, and Attenuation Measurement of a Thin Layer by Time-Resolved Acoustic Microscopy

A Novel Laser Ultrasonic Thickness Measurement Method for Metal Plate Based on Spectral Analysis

Simultaneous Measurement of Elastic Moduli, Attenuation, Density, and Thickness of a Layer by Ultrasonic Spectroscopy Using Point-Focus Transducer

THE COMPARISON OF LONGITUDAL PULSE-ECHO AND LAMB WAVES IN THE APPLICATION OF THIN-LAYERED STRUCTURE CHARACTERIZATION

A Novel Technique for the Measurement of the Acoustic Properties of a Thin Linear-Viscoelastic Layer Using a Planar Ultrasonic Transducer

An ultrasonic methodology for determining the mechanical and geometrical properties of a thin layer using a deconvolution technique.

Determination of the Multiple Local Properties of Thin Layer with High Lateral Resolution by Scanning Acoustic Microscopy.

Simultaneous Measurement of Local Longitudinal and Transverse Wave Velocities, Attenuation, Density, and Thickness of Films by Using Point-Focus Ultrasonic Spectroscopy

The Method of Ultrasonic Thickness Measurement for Surface Coatings Materials Based on Spectral Analysis

Simulation of Layer Thickness Measurement in Thin Multi-Layered Material by Variable-Focus Laser Ultrasonic Testing

A Phase Spectrum Method For The Measurement Of Liquid-Layer Thickness

Theoretical research on thickness measurement of fluid layer in mechanical structure by using ultrasonic technique

Multi-mode Ultrasonic Waves Focusing in a Variable Focus Technique for Simultaneous Sound-Velocity and Thickness Measurement

ULTRASONIC SIGNAL-PROCESSING CONCEPTS FOR MEASURING THE THICKNESS OF THIN LAYERS

Parameter Measurement of Thin Elastic Layers Using Low-Frequency Multi-Mode Ultrasonic Lamb Waves

Thickness Measurement of Liquid Layer in Mechanical Structure Using Ultrasonic Resonant Technique

Ultrasonic Thickness Measurement Method and System Implementation Based on Sampling Reconstruction and Phase Feature Extraction

A New Method for Measuring Multilayer Thickness Using a Chromatic Confocal Sensor

Comparative Research on Ultrasonic and THz Methods for Thickness Measurement of Thermal Barrier Coatings