Pseudo Color DEM in Industrial CT Section Image Inspection

肖永顺,张丽,陈志强,康克军
DOI: https://doi.org/10.3969/j.issn.0258-0934.2003.02.014
2003-01-01
Abstract:In this paper, Digital Elevation Model (DEM) and pseudo color technology combined to form an algorithm for ICT section image display. This method has been implemented in our large industrial CT image reconstruction and inspection system and received good result. What's more, we can make full use of the information in CT section image to enhance visual effects and capability of defects detection.
What problem does this paper attempt to address?