Feature extraction of potato external defect based on HIT

Quanwu TANG,Chongsheng SHI,Zhejun TANG
DOI: https://doi.org/10.3969/j.issn.1005-9369.2014.06.019
2014-01-01
Abstract:To get feature extraction of potato hyperspectral image external defect, a method is proposed based on hyperspectral imaging technology, principal component analysis, wavelet transform and the advanced Otsu. The fundamental principle is that using principal component analysis (PCA) and independent principal component analysis (ICA) for al band (468-960 nm) of potato hyperspectral image to gain principal components image, and then using of 4 scale sym4, Haar, db4 wavelet transform to reconstruct higher resolution image and assessing the effects of the method with wavelet transform to process principal components image, final y, a advanced segmentation algorithm of Otsu was applied to obtain potato external defect. Experimental results showed that the accuracy was 94.2% for extracting characteristics of potato sickness spot, the mechanical damage and holes based on hyperspectral imaging technology, principal component analysis, wavelet transform and the advanced Otsu.
What problem does this paper attempt to address?