Application of near-infrared hyperspectral imaging in detecting potato external defects

Wen-Hao Su,He Jianguo,Guishan Liu,Songlei Wang,He Xiaoguang,Wu Longguo
2013-01-01
Abstract:In order to explore the feasibility of on-line nondestructive testing on various potato external defects,a suitable detection method was developed based on hyperspectral image technology in nir spectral region of 900~1 700nm.Five defective potato types and one qualified potato type were used as the research object,and their hyperspectral images were obtained.Then the reflectance spectrums were extracted from the interested areas in these hyperspectral images.Principal component analysis was used for spectral data dimension reduction by selecting seven feature wavelengths(990,1 026, 1 109,1 226,1 285,1 464and 1 619nm).Then principal component analysis was conducted again based on the selected the characteristic wavelengths,and elected the second principal component image that used in image recognition of potato external defects,with the recognition rateing achieving 71.25%.In order to improve the recognition rate,band ratio algorithm combined with principal component analysis method of the characteristic wavelengths was put forward,and the recognition rate was up to 97.08%.The experimental results showed that the method based on near infrared hyperspectral image could identify the potato external defects effectively.
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