In-situ high pressure X-ray diffraction of phase E to 15 GPa

Sean R. Shieh,Ho-kwang Mao,Jürgen Konzett,Russell J. Hemley
DOI: https://doi.org/10.2138/am-2000-5-616
IF: 3.066
2000-01-01
American Mineralogist
Abstract:In-situ high pressure X-ray diffraction of phase E (free of secondary phases) measured up to 14.5 GPa shows that phase E is stable over this pressure range at room temperature. The pressure dependence of the lattice parameters are a = 2.967 - 0.011 P + 0.0001 P-2 and c = 13.886 - 0.054 P + 0.001 P-2 (P is in GPa). A least-squares fit to third-order of Eulerian strain theory yields a bulk modulus K-T0 for phase E of 93 (+/-4) GPa and pressure derivative K-T0' of 5 (+/-1). The bulk modulus obtained by this study is about 10% lower than that obtained by Brillouin scattering. Phase E appears to have the lowest bulk modulus among DMHS. The OH stretching frequency of 3613 cm(-1) indicates weak, if any, hydrogen bonding. The associated O-O distance of phase E is estimated to be 3.00-3.10 Angstrom.
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