High-pressure synchrotron x-ray diffraction and infrared microspectroscopy: applications to dense hydrous phases

Z Liu,J Hu,H Yang,H K Mao,R J Hemley
DOI: https://doi.org/10.1088/0953-8984/14/44/349
2002-01-01
Abstract:Synchrotron x-ray diffraction (XRD) and infrared (IR) absorption spectra of hydrous and 'anhydrous' forms of phase X Were measured to 30 GPa at room temperature. Three OH stretching modes were found in the hydrous phase, and surprisingly one sharp OH mode Was observed in the previously characterized anhydrous phase. All OH stretching modes soften and broaden with increasing pressure and become very weak above similar to20 GPa. XRD indicates that the crystal structure remains stable up to 30 GPa. Combining IR absorption and XRD results, the behaviour is attributed to pressure-induced distortion of the Si2O7 groups and disorder of the hydrogen atoms. The bulk moduli of the hydrous and 'anhydrous' phases are in the region of 74 GPa.
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