Line Scan Analysis of the Component of Ru Porcelain by SRXRF Method

朱剑,毛振伟,杨益民,冯敏,王昌燧,孙新民,郭木森,黄宇营,何伟
DOI: https://doi.org/10.3321/j.issn:0253-3219.2002.10.018
2002-01-01
Abstract:The technique of the SRXRF line scan analysis was used to measure contents of 11 elements at the broken plane of the Ru porcelain from porcelain glaze to body. It is found that there exists a great different layer of contents of elements between the porcelain glaze and body. The mechanism may be that in the process of firing the porcelain, materials of glass-glaze of porcelain glaze infiltrate into the surface of porcelain body, that could fit the phenomenon of observation by different microscopes (stereomicroscope, polarizing microscope and scanning electron microscope).
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