Oxygen-Vacancy-Related High-Temperature Dielectric Relaxation In Srtio3 Ceramics
Xiaofei Wang,Xiaomei Lü,Chao Zhang,Xiaobo Wu,Wei Cai,Song Peng,Huifeng Bo,Yi Kan,Fengzhen Huang,Jinsong Zhu
DOI: https://doi.org/10.1063/1.3430987
IF: 2.877
2010-01-01
Journal of Applied Physics
Abstract:Quantum paraelectric SrTiO3 has resulted in many investigations because of the anomalous properties. Here, using the conventional solid-state reaction method, we fabricated polycrystalline SrTiO3 ceramics with pure cubic perovskite structure. A dielectric loss peak is observed at around 450 K and 100 Hz and it shifts to higher temperature with increasing frequency. The typical high-temperature dielectric relaxation process is confirmed to be related to the oxygen vacancies (OVs) inside ceramics. More interestingly, a Cole-Cole fitting to loss peaks reveals a weaker correlation among OVs for such dielectric materials compared with that of ferroelectrics. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3430987]