STED SUPER RESOLUTION MICROSCOPE BASED ON A FIRST ORDER BESSEL BEAM, AND ADJUSTING METHOD
Kebin Shi,Peng Xi,Wentao Yu,Qihuang Gong
2018-01-01
Abstract:An STED super-resolution microscope based on a first-order Bessel beam, and an adjusting method. The STED microscope comprises: an excitation light source (1), a loss light source (2), an excitation light expanded beam alignment system (3-1), a loss light expanded beam alignment system (3-2), a spiral-shaped phase plate (4), a Bessel beam generation system (6), a loss light focus lens (14), a beam combination system (8), an objective lens (9), a piezoelectric scanning system (10), a filter (11), a signal collection system (12), and a single photon detector (13); the loss light being a first-order Bessel beam, the loss light itself having anti-scattering and self-healing characteristics, and being capable of keeping the spot shape well at a deeper position of a sample, thereby improving the resolution of a deep region of the sample. Compared with the method of achieving deep-layer imaging of an STED super resolution microscope by means of adjusting the correction ring of the objective lens, the present invention is simpler in the experimental operations, without requiring active adjustment; compared with the method in which an adaptive optical system is used, the experimental apparatus is simpler and cheaper.