STED Imaging by Using Hollow Bessel Beam

Wentao Yu,Ziheng Ji,Xusan Yang,Zibo Gong,Yun-Feng Xiao,Peng Xi,Kebin Shi
DOI: https://doi.org/10.1364/FIO.2015.FTu3D.6
2015-01-01
Abstract:We report a STED microscope by using Bessel beam. Improved lateral resolution of deep-imaging at 84μm-depth was observed as 150nm, with comparison to a standard STED imaging resolution of 275nm measured at the same depth.
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