Abstract:Structure determination is a key application of XFELs and 4th generation synchrotron sources, particularly using the coherent and pulsed X-ray radiation from X-ray free-electron lasers (XFEL). Scientific interest focuses on understanding the physical, biological, and chemical properties of samples at the nanometer scale. The X-rays from XFELs enable Coherent X-ray Diffraction Imaging (CXDI), where coherent X-rays irradiate a sample, and a far-field diffraction pattern is captured by an imaging detector. By the nature of the underlying physics, the resolution, at which the sample can be probed with the CXDI technique, is limited by the wavelength of the X-ray radiation and the exposure time if a detector can record the diffraction pattern to very large scattering angles. The resolution that can be achieved under real experimental conditions, depends strongly on additional parameters. The Shannon pixel size, linked to the detector resolution, the coherent dose that can be deposited in the sample without changing its structure, the image contrast, and the signal-to-noise ratio of the detected scattered radiation at high $q$, i.e. at high scattering angles $2\Theta$, have a strong influence on the resolution. The signal-to-noise ratio at high $q$ defines the "effective" maximum solid angle in a specific experiment setup up to which a detector can efficiently detect a signal and in consequence determines the achievable resolution. The image contrast defines how well bright image features can be distinguished from dark ones. We present the preliminary results of our study on the influence of the PSF on SNR, image contrast, position resolution, and achievable sample resolution for different pixel sizes.

Focal Construct Geometry for High Intensity Energy Dispersive X-Ray Diffraction Based on X-Ray Capillary Optics

Energy-resolving large area X-ray imaging enabled by stacked metal halide scintillators

Enhancing the performance of fluorescence emission difference microscopy using beam modulation

High-Resolution Scanning X-ray Diffraction Microscopy

Breaking the Diffraction Barrier Using Fluorescence Emission Difference Microscopy

High-Throughput Powder Diffraction Using White X-Ray Beam and a Simulated Energy-Dispersive Array Detector

Application Of Monolithic Capillary Half Focusing X-Ray Lens In Micro-Exafs Analytical Technology

Radiation-damage-free ghost diffraction with atomic resolution

Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors

Dynamical Diffraction of High-Energy Electrons Investigated by Focal Series Momentum-Resolved Scanning Transmission Electron Microscopy at Atomic Resolution.

Experimental Demonstration of X-Ray Fluorescence CT Using a Spatially Distributed Multi-Beam X-Ray Source

On the Influence of Parallax Effects in Thick Silicon Sensors in Coherent Diffraction Imaging

Focusing Polycapillary To Reduce Parasitic Scattering For Inelastic X-Ray Measurements At High Pressure

Application of a Monolithic Polycapillary X-ray Lens in EXAFS Experiments

X-ray diagnostics for the cavity-based x-ray free-electron laser project

A high-resolution and high-efficiency x-ray spectrometer based on a multi-cone crystal

Cold Cathode Coherent-Structure Flat Panel X-Ray Source Using Microarray Metal Target

In-situ single-shot diffractive fluence mapping for X-ray free-electron laser pulses

Metabolomics: Unraveling the chemical individuality of common human diseases

A Compact Dispersive Refocusing Rowland Circle X-ray Emission Spectrometer for Laboratory, Synchrotron, and XFEL Applications

Focusing and Energy Dispersion Properties of a Cylindrically Bent Asymmetric Laue Crystal