Genetic Analysis of Seedling Resistance to Stripe Rust in Four Wheat-Leymus mollis Translocation Lines

zhang yu,li qian,chao kaixiang,xue nan,wu lei,jing jinxue,li qiang,wang baotong

DOI: https://doi.org/10.7606/j.issn.1004-1389.2015.02.009

2015-01-01

Abstract:Wheat stripe rust,caused by Puccinia striiformis f.sp.tritici(Pst),is one of the most important diseases of wheat in China.Breeding and growing resistant cultivars is the most effective approach to control the disease.To develop and use stripe rust resistance gene(s)fromLeymus mollis,the prevalent Pst races CYR32 and CYR33 were used to identify F1,F2,and F3 generations derived from wheat-Leymus mollis translocation lines M851-1,M8724-1,M8725-2and M8657-2crossed with wheat cultivar Mingxian 169 at the seedling stage under controlled greenhouse condition.The genetic analysis results showed that the resistance of M851 to Pst race CYR32 was controlled by one recessive gene;the resistance of M8724-1to CYR32 was controlled by two recessive genes,and to CYR33 was controlled by one recessive gene;the resistance of M8725-2to CYR32 was controlled by two dominant complementary genes and to CYR33 was controlled by one dominant gene and one recessive gene;the resistance of M8657-2to CYR32 was controlled by one recessive gene and to CYR33 were controlled by two dominant genes.The results will further accelerate application of thesetranslocation lines in wheat breeding programs.