Nonlinear Reconstruction of Multilayer Media in Scanning Microwave Microscopy.

Zhun Wei,Rui Chen,Xudong Chen
DOI: https://doi.org/10.1109/TIM.2018.2834058
IF: 5.6
2019-01-01
IEEE Transactions on Instrumentation and Measurement
Abstract:Scanning microwave microscopy (SMM) is a nanoscale characterization technique widely used to image electrical or magnetic properties of materials at microwave frequencies. Nevertheless, it is challenging to reconstruct the properties of materials from measured SMM signals, and it is even difficult to retrieve multilayer media directly from measured signals. This paper proposes a nonlinear inversio...
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