Seed viability testing model of sweet corn based on artificial neural network and binary logistic regression
liu minjie,xu xuan,wang jianhua,sun qun,xiang chunyang
DOI: https://doi.org/10.11841/j.issn.1007-4333.2018.07.01
2018-01-01
Abstract:In order to test the vitality of sweet corn seed quickly and efficiently,several physical characteristics(red,green,blue,hues,saturation,brightness,light,a,b,width,length and projected area)of a certain cultivar of sweet corn,Jinfei,were obtained in batch and quickly went through image recognition technology(Seed Identification software).Each seed viability was confirmed through single seed germination test,and a model for seed viability discrimination of Jinfei was established by applying principle component analysis,artificial neural network and binary logistic regression.The results showed that:1)a,b,saturation,width and projection area all had significant correlation with the seed vigor and relatively high variation coefficient.For the seeds with a≤3,the germination percentage was increased from 72.7% to 77.6%,and the selected rate reached to 79.4%.For the seeds with projection area≤77.31 mm2,the germination percentage can be increased to 73.7% and the selected rate reached 87.6%.2)Based on13 standardized physical indicators,artificial neural network model with double hidden layers(training set∶testing set=6∶4)possessed an overall predicting accuracy at 74.2%,germination percentage also reached to 76.9%,with93.8% quality seed selection.3)The germination percentage of binary logistic regression was 74.5%,but the model stability of Artificial Neural Network model was better than binary logistic regression.These results would provide references for further research and implementation of quality seed sorting technology.