Abstract:Optical frequency combs of the femtosecond laser have been widely used in time-frequency technology and precision spectrum measurement. The absolute ranging technology derived from time-frequency characteristics of the optical frequency comb is expected to become the incomparable means of length metrology and distance measurement in the future due to its traceability to time-frequency standard and capability of large scale and high precision. This paper proposes a real-time absolute ranging method with multi-wavelength interferometry referenced to optical frequency comb, which enables multiple continuous-wave lasers to be synchronously calibrated to selected modes of the frequency comb by means of optical phase-locked loop. With synchronous phase measurement and calculation with excess fraction algorithm, absolute distance measurement by multi-wavelength interferometry is ultimately fulfilled. The proposed measurement method can not only retain high resolution and high accuracy of traditional laser interferometry, but also can be traced to a time-frequency reference, which is of metrological significance to high-precision length and distance measurement, especially to the definition of "meter" for physical reproduction. Measured results for ranging experiments have proved that the non-ambiguity range of the four-wavelength interferometer reaches 44.6 mm, and fluctuations of air refractive index cause the non-ambiguity range change with the order of nanometers. Through theoretical analysis, it is pointed out that the non-ambiguity range of the multi-wavelength interferometer in the actual measurement environment is restricted by the calculated error of air refractive index, especially the estimation accuracy and fluctuation degree of the refractive index relationship between wavelengths. And in a good laboratory conditions, the non-ambiguity range of real-time absolute ranging by frequency-comb-calibrated multi-wavelength interferometry can reach several meters or even tens of meters. At the same time, a 2-meter linear displacement comparison has been carried out, the P.V. value of the residual errors for linear fitting is 36.1 nm, and such residual errors match the magnitude of uncertainty of air refractive index calculated by empirical formula, which prove that the multi-wavelength interferometry can perform meter-level absolute ranging. The proposed research can be directly applied to precision manufacturing of large-scale semiconductors up to several meters, and is beneficial to promoting the accuracy of laser ranging for space mission.

Real-time free spectral range measurement based on optical single-sideband technique.

Thin‐Film‐Lithium‐Niobate Photonic Chip for Ultra‐Wideband and High‐Precision Microwave Frequency Measurement

High Spectral Efficiency Long-Wave Infrared Free-Space Optical Transmission with Multilevel Signals

Real-time free spectral range measurement based on a correlated resonance-tracking technology

Fano-resonance-based ultra-high-resolution ratio-metric wavelength monitor on silicon.

Photonic-Assisted Microwave Frequency Measurement System Based on A Silicon Orr

Free-spectral-range-free Filters with Ultrawide Tunability Across the S + C + L Band

Measurement of the Reflection and Loss of the Hybrid Air-Core Photonic-Bandgap Fiber Ring Resonator

Microring Based Ratio-Metric Wavelength Monitor on Silicon

Novel High Performance Fano Resonance Sensor with Circular Split Ring Resonance

A Widely Tunable Twin-Fano Resonator for Wavelength Monitor

Instantaneous Microwave Frequency Measurement with a Uniform Resolution and Improved Dynamic Range

High‐Resolution 2D Quasi‐Distributed Optical Sensing with On‐Chip Multiplexed FSR‐Free Nanobeam Cavity Array

Temperature-insensitive Waveguide Sensor Using a Ring Cascaded with a Mach-Zehnder Interferometer

Measurement of the Effective Refractive Index of Silicon-on-Insulator Waveguide Using Mach–Zehnder Interferometers

Ultra-compact Mode-Split Silicon Microring Resonator for Format Conversion from NRZ to FSK

All-Optical Approach to Microwave Frequency Measurement with Large Spectral Range and High Accuracy

Ultra-sharp asymmetric Fano-like resonance spectrum on Si photonic platform

Real-time Absolute Distance Measurement by Multi-Wavelength Interferometry Synchronously Multi-Channel Phase-Locked to Frequency Comb and Analysis for the Potential Non-Ambiguity Range

High-resolution Si3N4 spectrometer: architecture & virtual channel synthesis and experimental demonstration

Research on Fiber-Optic Optical Coherence Ranging System Based on Laser Frequency Scanning Interferometry