Facilitated Extrinsic Majority Carrier Depletion And Photogenerated Exciton Dissociation In An Annealing-Free Zno:C Photodetector

Dezhong Zhang,Chunyu Liu,Kanzhe Li,Yu Chen,Shengping Ruan,Xindong Zhang,Chuannan Li
DOI: https://doi.org/10.1039/c8nr00214b
IF: 6.7
2018-01-01
Nanoscale
Abstract:Applications of ZnO in photodetectors are limited by the great quantity of extrinsic majority carriers due to structural defects and difficult exciton dissociation due to the large exciton binding energy; these generally lead to a higher dark current (I-d) and lower light current (I-l), severely degrading the responsivity and detectivity. C dots are incorporated into an annealing-free ZnO layer to innovatively construct a local built-in electric field (E-bi) using the difference in the work functions; this simultaneously overcomes the drawbacks of the pristine ZnO photosensitive layer. In dark, the extrinsic majority carrier of ZnO is depleted around the incorporated C dots due to the self-depleting effect; thus, the I-d decreases. Under UV illumination, the photogenerated exciton driven by the local E-bi is easily dissociated into a free charge carrier, contributing to the improved I-l. This study paves a universal way to effectively improve the detection characteristics of photoconductive devices by incorporating the local E-bi.
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