Method for extending the depth of focus in X-ray microscopy.

Fahu Li,Yong Guan,Ying Xiong,Xiaobo Zhang,Gang Liu,Yangchao Tian
DOI: https://doi.org/10.1364/OE.25.007657
IF: 3.8
2017-01-01
Optics Express
Abstract:Transmission X-ray microscopy (TXM) is a powerful, nondestructive and three-dimensional imaging tool that has been applied in many fields. However, the ability to image large size samples using high-resolution TXM is restricted due to a limited depth of focus (DOF). In this study, a method based on multiple reconstructed slice stacks of an extended sample at different focal positions is developed to extend the DOF of TXM. The simulation and experimental results demonstrate that this novel method effectively and reliably extend the DOF of high-resolution TXM. (C) 2017 Optical Society of America
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