The Best of Both Worlds : 3 D X-ray Microscopy with Ultra-high Resolution and a Large Field of View

W. Li,J. Gelb,Y. Yang,Y. Guan,W. Wu,J. Chen,Y. Tian
DOI: https://doi.org/10.1063/1.3625354
2011-01-01
AIP Conference Proceedings
Abstract:3D visualizations of complex structures within various samples have been achieved with high spatial resolution by X‐ray computed nanotomography (nano‐CT). While high spatial resolution generally comes at the expense of field of view (FOV). Here we proposed an approach that stitched several 3D volumes together into a single large volume to significantly increase the size of the FOV while preserving resolution. Combining this with nano‐CT, 18‐μm FOV with sub‐60‐nm resolution has been achieved for non‐destructive 3D visualization of clustered yeasts that were too large for a single scan. It shows high promise for imaging other large samples in the future.
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