Abstract:Recent trends of interferometric wavefront sensing tend to focus on high precision, anti-vibration, compact, along with much more involved of electric and computer technology. And the optical principles employed not only limit to interference but also include diffraction, scattering, polarization, etc. In this paper, some selected examples basing on the research works in our group will be given to illustrate the trends mentioned above. To achieve extra high accuracy, phase-shifting point diffraction interferometry (PS-PDI) is believed to be a good candidate as it employs a nearly perfect point diffraction spherical wavefront as the reference and also takes advantage of the high precision of phase-shifting algorithms. Cyclic radial shearing interferometry (C-RSI) successively demonstrate the anti-vibration characteristic and can diagnose transient wavefront with only one single shot by employing a three-mirror common-path configuration and a synchronizing system. In contrast sharply with those early interferometers, interferometers with very compact configuration are more suitable to develop portable wavefront sensing instruments. Cross-grating lateral shearing interferometer (CG-LSI) is a very compact interferometer that adopts a cross-grating of millimeters to produce lateral shearing of the diffraction wave of the test wavefront. Be aware that, computer technique has been used a lot in all of the above interferometers but the non-null annual sub-aperture stitching interferometer (NASSI) for general aspheric surface testing mostly relies on the computer model of the physical interferometer setup and iterative ray-tracing optimization. The principles of the above mentioned interferometric wavefront sensing methods would be given in detail.

Pushing Phase and Amplitude Sensitivity Limits in Interferometric Microscopy

High-sensitivity Quantitative Phase Microcopy (conference Presentation)

High-Sensitivity Quantitative Phase Microcopy

Modeling the Depth-Sectioning Effect in Reflection-Mode Dynamic Speckle-Field Interferometric Microscopy.

Solving the Inverse Scattering Problem in Reflection-Mode Dynamic Speckle-Field Phase Microscopy (conference Presentation)

Beating Temporal Phase Sensitivity Limit in Off-axis Interferometry based Quantitative Phase Microscopy

Anti Light Disturbance Analysis of the Measurement of High Precision micro Displacement

Recent Developments of Interferometric Wavefront Sensing

Pushing the Boundaries: Interferometric Mass Photometry at the Quantum Limit of Sensitivity

Interferometry with few photons

Experimental investigation of a multi-photon Heisenberg-limited interferometric scheme: the effect of imperfections

Ultrasensitive measurement of MEMS cantilever displacement sensitivity below the shot noise limit

Quantum fluctuations and noise in interferometry and photodetection: Applications in optical sensing and micromanipulation

Measurement of Micro-scale Experimental Mechanics Based on Stage of Optical and Scanning Microscopes

Real‐Time Superresolution Interferometric Measurement Enabled by Structured Nonlinear Optics

Quantitative Interferometric Microscopy with Improved Full-Field Phase Aberration Compensation

Phase Nanoscopy with Correlated Frequency Combs

Retrieval of phase information from low-dose electron microscopy experiments: are we at the limit yet?

Super-resolution imaging based on active optical intensity interferometry

Sensitivity improvement of submicron dynamic displacement measurement system composed of phase-modulated fiber optic interferometer