Feedback-Based Low-Power Soft-Error-Tolerant Design for Dual-Modular Redundancy.

Yan Li,Yufeng Li,Han Jie,Jianhao Hu,Fan Yang,Xuan Zeng,Bruce Cockburn,Jie Chen
DOI: https://doi.org/10.1109/tvlsi.2018.2819896
2018-01-01
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Abstract:Triple-modular redundancy (TMR), which consists of three identical modules and a voting circuit, is a common architecture for soft-error tolerance. However, the original TMR suffers from two major drawbacks: the large area overhead and the vulnerability of the voter. In order to overcome these drawbacks, we propose a new complementary dual-modular redundancy (CDMR) scheme for mitigating the effect of soft errors. Inspired by the Markov random field (MRF) theory, a two-stage voting system is implemented in CDMR, including a first-stage optimal MRF structure and a second-stage high-performance merging unit. The CDMR scheme can reduce the voting circuit area by 20% while saving the area of one redundant module, achieving at least 26% error-rate reduction at an ultralow supply voltage of 0.25 V with 8.33% faster timing compared to previous voter designs.
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