An Automatic Detection System for Film Capacitor Based on Dcs Theory

Zhichao Yan,Yuxiang Yang,Mingyu Gao,Ke Yin,Zhiwei He
DOI: https://doi.org/10.1109/isie.2016.7745007
2016-01-01
Abstract:In this paper, an automatic pipeline system is proposed to detect the exterior defects of film capacitors. The industrial personal computer (IPC) and micro-controller unit (MCU) are used in the pipeline as the main controllers. And the distributed control system (DCS) theory is applied to build the platform. Specifically, the proposed automatic detection system consists of image processing structure, mechanical separation structure and conveyor structure. The Nonsubsampled wavelet transform (NSWT) based algorithm is applied to check the exterior defects of film capacitors in the image processing structure. Then the detection results are sent via the serial port to the mechanical separation structure, and the defective capacitors are peeled off the production line by motor. In practical production, the proposed system can be integrated with the original production line effectively, and can improve the detection efficiency and reduce the production costs significantly.
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