Three-Dimensional shape measurement method based on speckle pattern with prior phase information

Dai Xianqiang,Gai Shaoyan,Da Feipeng
DOI: https://doi.org/10.19650/j.cnki.cjsi.2014.12.018
2014-01-01
Abstract:A three-dimensional shape measurement system based on the projection of one digital speckle pattern and phase-shifted fringe patterns is proposed. The preliminary corresponding point of each pixel can be obtained by the projection of a digital speckle pattern onto the surface of the project, and the correspondence refinement using wrapped phase map is performed, which is calculated by projecting phase-shifted fringe patterns. Unlike the conventional methods, the proposed method can determine the location of the correspondence points in different views by the digital speckle pattern, and the phase unwrapping algorithm is not required to obtain the absolute phase, so each pixel can explore its corresponding point directly from the wrapped phase map. Experiments demonstrate that the proposed method can achieve high-quality three-dimensional measurement and shorten the time as compared with the traditional method. Therefore, the method enhances the practicability of the system.
What problem does this paper attempt to address?