A Function Verification Method Based on the Models at Test Case Level

Zheng XIE,Mingjiang WANG,Shanshan YONG,Xin'an WANG
DOI: https://doi.org/10.3969/j.issn.1005-9490.2017.05.001
2017-01-01
Abstract:Aiming at the completeness and reusability in the integrated circuit function verification,the models at the test case level are proposed to build a protocol-oriented verification plan with complete functional coverage.The models cooperate with a verification environment built by UVM method and UVM library for an 800/900 MHz RFID system complied with GJB protocol. The models at test case level have generality. The models filled with protocol content meet the reusability between designs complied with the same protocol and the reusability between similar or nonholo-nomic protocols. That is a protocol-oriented VIP at the test case level and its construction method. Finally the models guarantee the verification coverage of the GJB protocol chip to tape out successfully in TSMC 0.18μm.
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