Abstract:<p>The evolution of wide bandgap semiconductor materials has led to dramatic improvements for electronic applications at high powers and temperatures. However, the propensity of extended defects provides significant challenges for implementing these materials in commercial electronic and optical applications. While a range of spectroscopic and microscopic tools have been developed for identifying and characterizing these defects, such techniques typically offer either technique exclusively, and/or may be destructive. Scattering‐type scanning near‐field optical microscopy (s‐SNOM) is a nondestructive method capable of simultaneously collecting topographic and spectroscopic information with frequency‐independent nanoscale spatial precision (≈20 nm). Here, how extended defects within 4H‐SiC manifest in the infrared phonon response using s‐SNOM is investigated and the response with UV‐photoluminescence, secondary electron and electron channeling contrast imaging, and transmission electron microscopy is correlated. The s‐SNOM technique identifies evidence of step‐bunching, recombination‐induced stacking faults, and threading screw dislocations, and demonstrates interaction of surface phonon polaritons with extended defects. The results demonstrate that phonon‐enhanced infrared nanospectroscopy and spatial mapping via s‐SNOM provide a complementary, nondestructive technique offering significant insights into extended defects within emerging semiconductor materials and devices and thus serves as an important diagnostic tool to help advance material growth efforts for electronic, photonic, phononic, and quantum optical applications.</p>

Internal nanostructure diagnosis with hyperbolic phonon polaritons in hexagonal boron nitride

Wide-Field Spectral Super-Resolution Mapping of Optically Active Defects in Hexagonal Boron Nitride.

Nanoscale mapping and spectroscopy of non-radiative hyperbolic modes in hexagonal boron nitride nanostructures

Subdiffractional focusing and guiding of polaritonic rays in a natural hyperbolic material

Revealing Nanoscale Confinement Effects on Hyperbolic Phonon Polaritons with an Electron Beam

Revealing Abnormal Phonon Polaritons Confined at the Edge of Curved Two-Dimensional Boron Nitride

High- Q dark hyperbolic phonon-polaritons in hexagonal boron nitride nanostructures

Four-dimensional vibrational spectroscopy for nanoscale mapping of phonon dispersion in BN nanotubes.

High-quality nanocavities through multimodal confinement of hyperbolic polaritons in hexagonal boron nitride

Imaging of Optically Active Defects with Nanometer Resolution

Direct observation of highly confined phonon polaritons in suspended monolayer hexagonal boron nitride

Nanofocusing of Hyperbolic Phonon-Polaritons in a Tapered Boron Nitride Slab

Hyperbolic Whispering-Gallery Phonon Polaritons in Boron Nitride Nanotubes

Nanoimaging of resonating hyperbolic polaritons in linear boron nitride antennas

Exploiting Phonon‐Resonant Near‐Field Interaction for the Nanoscale Investigation of Extended Defects

Engineering spin defects in hexagonal boron nitride

Optical Imaging of Ultrafast Phonon-Polariton Propagation through an Excitonic Sensor

Tunable Phonon Polariton Hybridization in a van der Waals Hetero‐Bicrystal

Phonon-Enhanced Nonlinearities in Hexagonal Boron Nitride

Unidirectional hyperbolic whispering-gallery phonon-polariton excitation in boron nitride nanotubes

Negative refraction in hyperbolic hetero-bicrystals