Development of Diagnosis System for Saw Devices Based Upon Spectrogramme Analysis

M KOIKE,J SHIOKAWA,K HASHIMOTO,M YAMAGUCHI
DOI: https://doi.org/10.7567/jjaps.31s1.204
1992-01-01
Abstract:The paper describes the development of a simple but effective diagnosis system for SAW devices based on one of the time-frequency distributions, spectrogramme analysis. The system is realised by employing a personal computer, auxiliary memories and some input/output devices, by which SAW device response measured by a vector network analyser is data-processed, and the result is visualised to be displayed on a CRT. The system was applied to the analysis and identification of the second-order effects in SAW devices, and some visualised results were demonstrated.
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