Mechanical Deformation Effects on Flexible Thin Film Transistors: A Comparison Between 6,13‐Bis(Triisopropylsilylethynyl)Pentacene and N,N′‐Bis‐(2‐Ethylhexyl)‐1,7‐Dicyanoperylene‐3,4:9,10‐bis(Dicarboximide) Derivatives
A. Mascia,M. Concas,E. Podda,G. Casula,S. Lai,P. Cosseddu
DOI: https://doi.org/10.1002/admi.202400783
IF: 5.4
2024-11-28
Advanced Materials Interfaces
Abstract:This work examines the impact of surface strain on the electrical properties of two widely employed organic semiconductors, TIPS‐Pentacene and N1400. Electromechanical tests on flexible transistors reveal that while both materials are affected by mechanical deformation, N1400 demonstrates superior stability. XRD and AFM analyses attribute these differences to strain‐induced changes in thin‐film morphology, offering new insights into material performance. In this work, the investigation of the surface strain‐induced electrical changes in two commonly employed solution‐processable organic semiconductors, i.e., 6,13‐bis(triisopropylsilylethynyl)pentacene (TIPS‐Pentacene) and N,N′‐bis‐(2‐ethylhexyl)−1,7‐dicyanoperylene‐3,4:9,10‐bis(dicarboximide) (N1400), is reported. A detailed electromechanical characterization of two sets of flexible organic field‐effect transistors is performed, clearly demonstrating that both systems are affected by mechanical deformation in terms of electrical performance. However, the N1400 system shows a much more stable and reproducible response, even after continuous mechanical stress. XRD and AFM analysis demonstrate that such difference is mainly related to the changes induced on the two thin film morphology by the applied deformations.
materials science, multidisciplinary,chemistry