Robust structure and morphology parameters for CdS nanoparticles by combining small‐angle X‐ray scattering and atomic pair distribution function data in a complex modeling framework

christopher l farrow,chenyang shi,pavol juhas,xiaogang peng,simon j l billinge
DOI: https://doi.org/10.1107/S1600576713034055
IF: 4.868
2014-01-01
Journal of Applied Crystallography
Abstract:In this work, the concept of complex modeling (CM) is tested by carrying out a co-refinement of the atomic pair distribution function and small-angle X-ray scattering data from CdS nanoparticles. It is shown that, compared with either single technique alone, the CM approach yields a more accurate and robust structural insight into the atomic structure and morphology of nanoparticles. This work opens the door for the application of CM to a wider class of nanomaterials and for the incorporation of additional experimental and theoretical techniques into these studies.
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