Nondestructive Quantitative Dopant Profiling Technique by Contact Radiography

H. Huang,R. B. Stephens,S. A. Eddinger,J. Gunther,A. Nikroo,K. C. Chen,H. W. Xu
DOI: https://doi.org/10.13182/fst49-650
2006-01-01
Abstract:We have developed the only non-destructive technique to profile graded dopants in ICF shells to the precision required by the NIF specifications (Doping level must be accurate to 0.03 at. % and its radial distribution accurate to submicron precision). This quantitative contact radiography method was based on precision film digitization and a dopant simulation model. The measurements on Cu/Be and Ge/CH shells agree with those from electron microprobe and X-ray fluorescence.
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