Measuring C Program Coverage Based on Binary Decision Diagrams

Shi Liang,Xu Baowen,Chen Lin
DOI: https://doi.org/10.1007/bf02687957
2005-01-01
Abstract:Test coverage analysis is a structural testing technique, which helps to evaluate the sufficiency of software testing. This letter presents two test generation algorithms based on binary decision diagrams to produce tests for the Multiple-Condition Criterion(M-CC) and the Modified Condition/Decision Criterion(MC/DC), and describes the design of the C program Coverage Measurement Tool (CCMT), which can record dynamic behaviors of C programs and quantify test coverage.
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