Mapping the Domain Wall Pinning Profile by Stochastic Imaging Reconstruction

Wanjun Jiang,Yabin Fan,Pramey Upadhyaya,Murong Lang,Minsheng Wang,Li-Te Chang,Kin L. Wong,Jianshi Tang,Mark Lewis,Jing Zhao,Liang He,Xufeng Kou,Caifu Zeng,X. Z. Zhou,Robert N. Schwartz,Kang L. Wang
DOI: https://doi.org/10.1103/physrevb.87.014427
IF: 3.7
2013-01-01
Physical Review B
Abstract:Polar magneto-optical Kerr effect microscopy and subsequent stochastic imaging reconstruction have been used to map out the distinct pinning profiles of randomly distributed intrinsic defects (pointlike/linelike), as well as their dependence on the external magnetic field in 2-\ensuremath{\mu}m-thick yttrium iron garnet films. A comparison of the pinning profiles produced by these intrinsic defects and the extrinsic defects (made by focused ion beam lithography) has also been made. In addition, we have found a linear dependence of the pinning potentials on the depths of the fabricated pointlike defects. Our observations should provide a fundamental understanding of the role of defects in domain wall spintronics.
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