Abstract:Here we show that compressive sensing allows 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and reduced electron fluence. The methodology needed to achieve these results compared to conventional 4-D approaches requires only that a random subset of probe locations is acquired from the typical regular scanning grid, which immediately generates both higher speed and the lower fluence experimentally. We also consider downsampling of the detector, showing that oversampling is inherent within convergent beam electron diffraction (CBED) patterns and that detector downsampling does not reduce precision but allows faster experimental data acquisition. Analysis of an experimental atomic resolution yttrium silicide dataset shows that it is possible to recover over 25 dB peak signal-to-noise ratio in the recovered phase using 0.3% of the total data. Lay abstract: Four-dimensional scanning transmission electron microscopy (4-D STEM) is a powerful technique for characterizing complex nanoscale structures. In this method, a convergent beam electron diffraction pattern (CBED) is acquired at each probe location during the scan of the sample. This means that a 2-dimensional signal is acquired at each 2-D probe location, equating to a 4-D dataset. Despite the recent development of fast direct electron detectors, some capable of 100kHz frame rates, the limiting factor for 4-D STEM is acquisition times in the majority of cases, where cameras will typically operate on the order of 2kHz. This means that a raster scan containing 256^2 probe locations can take on the order of 30s, approximately 100-1000 times longer than a conventional STEM imaging technique using monolithic radial detectors. As a result, 4-D STEM acquisitions can be subject to adverse effects such as drift, beam damage, and sample contamination. Recent advances in computational imaging techniques for STEM have allowed for faster acquisition speeds by way of acquiring only a random subset of probe locations from the field of view. By doing this, the acquisition time is significantly reduced, in some cases by a factor of 10-100 times. The acquired data is then processed to fill-in or inpaint the missing data, taking advantage of the inherently low-complex signals which can be linearly combined to recover the information. In this work, similar methods are demonstrated for the acquisition of 4-D STEM data, where only a random subset of CBED patterns are acquired over the raster scan. We simulate the compressive sensing acquisition method for 4-D STEM and present our findings for a variety of analysis techniques such as ptychography and differential phase contrast. Our results show that acquisition times can be significantly reduced on the order of 100-300 times, therefore improving existing frame rates, as well as further reducing the electron fluence beyond just using a faster camera.

Nanoscale 3D Refractive Indices Mapping on Native Cheek Cells by Axial Scanning Transmission Electron Tomography

Three-dimensional Super-Resolved Live Cell Imaging Through Polarized Multi-Angle TIRF

3-D Reconstruction of Cortical Microtubules Using Multi-Angle Total Internal Reflection Fluorescence Microscopy

High-resolution 3D reconstruction of microtubule structures by quantitative multi-angle total internal reflection fluorescence microscopy

Tomographic Imaging Ultra-Thick Specimens with Nanometer Resolution

Compressive Scanning Transmission Electron Microscopy

High-speed 4-dimensional scanning transmission electron microscopy using compressive sensing techniques

Time-Resolved Scanning Ion Conductance Microscopy for Three-Dimensional Tracking of Nanoscale Cell Surface Dynamics

Transport of Intensity Diffraction Tomography with Non-Interferometric Synthetic Aperture for Three-Dimensional Label-Free Microscopy

Three-dimensional mass density mapping of cellular ultrastructure by ptychographic X-ray nanotomography

Electron ptychographic microscopy for three-dimensional imaging

Nanometer Resolution Mass Spectro-Microtomography for In-Depth Anatomical Profiling of Single Cells

Electron tomography at 2.4 Å resolution

Iterative Phase Retrieval Algorithms for Scanning Transmission Electron Microscopy

Infrared nanoscopy and tomography of intracellular structures

Atomic Force Microscopy Imaging and 3-D Reconstructions of Serial Thin Sections of a Single Cell and Its Interior Structures

Three‐dimensional bright‐field scanning transmission electron microscopy elucidate novel nanostructure in microbial biofilms

Three-dimensional imaging of individual point defects using selective detection angles in annular dark field scanning transmission electron microscopy

Iterative Methods in Large Field Electron Microscope Tomography

Electron tomography for functional nanomaterials