Abstract:For a century, x-ray crystallography has been conducted with one of the two extreme sample conditions: either a single crystal which produces a single set of diffraction spots directly corresponding to the geometric orientation of the crystal, or a powder sample which comprises a huge number of crystals so numerous that the diffraction spots overlap and merge into smooth rings while the geometric relation is completely lost and only the d-spacings information of diffraction planes is observed. High-pressure DAC is not optimized for either condition. Powder x-ray diffraction has the intrinsic limitations when the sample consists of multiple different phases with low symmetry. Diffraction rings cover most of the detector area, and only a couple of low angle diffraction rings are unique to a phase; most other rings overlap with one another and cannot be used for unique identiﬁcation or accurate determination of crystallographic parameters. New structures and minor phases are often overshadowed by the diffraction of major phases and are impossible to ﬁnd or identify. Advanced crystallographic software, such as Rietveld and LeBail reﬁnement methods, may get most out of a powder pattern, but cannot overcome the intrinsic limitations. In addition, the common practice of integrating the 2D ring into a 1D peak plot throws away the valuable information of a whole dimension, such as the azimuthal angle of diffraction spot around the ring. Single-crystal XRD contains orientation and geometrical relationship in addition to d-spacings and thus provides a deﬁnitive characterization of the unit cell and symmetry. Unless the crystal is orientated exactly relative to the incident monochromatic x-ray beam to satisfy the Bragg relation, the crystal gives no signal, and the detector remains empty. Rotating the crystal around the w-axis (perpendicular to the incident x-ray beam) can bring the crystal to Bragg condition and occasionally obtain single diffraction spots at a given angle and scanning step. In spite of the advantages, single crystal cannot be sustained through phase transitions and often breaks down into multiple crystals and generate spotty XRD patterns. Spottiness, that is generally regarded as a ﬂaw in powder XRD, can be turned into great advantages if we can separate individual crystallites and handle them as individual single crystals. The high-brilliance x-ray beam available at synchrotron facilities has made it possible to collect diffraction spots in a powder sample comprised of up to hundreds of submicron crystallites. The newly developed Multigrain Crystallography (MGC) package, which is a suite of programs used for processing and indexing diffraction spots, has been developed to separate and identify the crystallographic orientation of each individual crystallite in the aggregate of hundreds of crystallites. Once separated, the data set for each crystallite can be handled with the standard single-crystal reﬁnement program identical to a stand-alone single crystal, resulting in excellent statistics in reﬁnement and full coverage of the reciprocal space. The MGC method is very powerful in unequivocal determination of symmetry and unit cells, testing different indexing models, picking out minor phases, and resolving strain of individual crystallites, and will very likely replace the powder and single-crystal x-ray diffraction methods as the dominant crystallographic tool for future high pressure-temperature studies in DAC.

Back Cover (Phys. Status Solidi A 12/2010)

CCDC 864374: Experimental Crystal Structure Determination

Applications of Direct Methods in Protein Crystallography for Dealing with Diffraction Data Down to 5 Å Resolution.

The diffraction power of crystals with unknown atomic structures: calculation and application in quantitative phase analysis

The Revolutionary Multigrain Crystallography Method for High-Pressure X-ray Diffraction

Unravelling Crystal Structures of Covalent Organic Frameworks by Electron Diffraction Tomography

X-ray Diffraction Data-Assisted Structure Searches.

On the Validity of the Direct Phasing and Fourier Method in Electron Crystallography

Research Progress on the Crystal Structure Determination Using Electron Diffraction

Solving the Crystallographic Phase Problem using Dynamical Scattering in Electron Diffraction

Crystal Structures from Powder Diffraction: Principles, Difficulties and Progress

Back Cover: Macromol. Rapid Commun. 14/2005

Electron Crystallography: Imaging and Single-Crystal Diffraction from Powders

Multiple Diffraction of X‐rays in Crystals, Springer Series in Solid‐State Sciences Vol. 50, Springer‐Verlag, Berlin/Heidelberg/New York/Tokyo 1984, 300 P., 152 Figures, 24 Tables, DM 148. ‐; ISBN 3‐540‐12955‐3

Beyond crystallography: Diffractive imaging using coherent x-ray light sources

Simulating Diffraction Photographs Based on Molecular Dynamics Trajectories of a Protein Crystal: a New Option to Examine Structure-Solving Strategies in Protein Crystallography.

Back Cover: A Fluorinated Chaperone Gives X‐ray Crystal Structures of Acyclic Natural Product Derivatives up to 338 Molecular Weight

Solving The X-Ray Phase Problem For Macromolecular Crystals By Multi-Wave X-Ray Interference

Using Phases Retrieved from Two-Dimensional Projections to Facilitate Structure Solution from X-Ray Powder Diffraction Data

Structural Biology Studies of the Avian Influenza H5n1 Virus

Solving Non-Periodic Structures Using Direct Methods: Phasing Diffuse Scattering