Comparative Study of Encapsulated Solution-Processed Zinc Oxide Ultraviolet Photodetectors with Different Contacts

Siying Li,Wei Tang,Xiaoli Xu,Motao Cao,Yizheng Jin,Xiaojun Guo
DOI: https://doi.org/10.1002/pssa.201431220
2014-01-01
Abstract:Ultraviolet (UV) photodetectors were fabricated with low temperature (<150 degrees C) solution-processed zinc oxide (ZnO) layers. A polydimethylsiloxane (PDMS) layer was used as the encapsulation to protect the devices from ambient effects. Current-voltage (I-V) characteristics, transient characteristics, and the encapsulation effect were compared for ohmic and Schottky contact devices that were formed with aluminum and silver electrodes, respectively. Schottky contact devices were shown to be able to achieve rapid response with the recovery time not affected by the encapsulation. (C) 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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