Three-Dimensional Analysis of Dielectric-Loaded Waveguide Discontinuity by Edge Fem Combined with Soc Technique
Rs Chen,Dx Wang,L Chang,L Zhu,K Wu
DOI: https://doi.org/10.1002/1098-2760(20001220)27:6<438::aid-mop20>3.0.co;2-s
IF: 1.311
2000-01-01
Microwave and Optical Technology Letters
Abstract:In this paper; the application of the edge-based vector finite-element method combined with the short-open calibration (SOC) technique to three-dimensional waveguide discontinuity was presented and is used to truncate the computational domain. The developed FEM algorithm is applied to the modeling of dielect-filled waveguide discontinuities that can be segmented into two distinct sections: the static model of feed lines, and the dynamic model of circuit discontinuity. The FEM is formulated in such a way that the port voltages, and currents are explicitly represented through relevant network matrices. The SOC technique is used to remove or separate unwanted parasitics brought, by the approximation of the impressed voltage source, as well as the problem of the resulting consistency between differ ent simulations. Truncation of the the computational domain by the SOC technique makes the iterative solvers for large sparse linear matrix equations from the FEM converge much faster than by perfectly matched layers (PML). Results for full-height/partially dielectric-filled waveguide discontinuities are very well compared with available publications. (C) 2000 John Wiley & Sons, Inc.