Investigations on the deformation behavior of polycrystalline Cu nanowires and some factors affecting the modulus and yield strength
Xia Tian,Junzhi Cui,Bowen Li,Meizhen Xiang
DOI: https://doi.org/10.1088/0965-0393/18/5/055011
IF: 2.421
2010-05-28
Modelling and Simulation in Materials Science and Engineering
Abstract:This paper consists of two parts. In the first part, the deformation behavior of polycrystalline Cu nanowires under tension, bending and torsion is studied by using molecular dynamics simulations. The results show that both free surfaces and grain boundaries can control the plastic deformation. In detail, for polycrystalline Cu nanowires under tension, the stress-assisted grain growth caused by atomic diffusion and grain boundary migration is found, which is thought to be the reason for necking. Then under the bending effect, full dislocations and deformation twins of polycrystalline Cu nanowires are found in the grains. Moreover, the twin boundaries act as obstacles to dislocation motion. Finally, full dislocations and fivefold deformation twins are detected in polycrystalline Cu nanowires in the torsional state. These phenomena are in good agreement with the experimental observations of Liao et al (2005 Appl. Phys. Lett. 86 103112). The second part investigates the effects of sample shape and crystallographic structure on the modulus and yield strength under tension, bending and torsion. The results demonstrate that the modulus (in particular the bending and torsion modulus) can be significantly influenced by both the effects; however, remarkable difference in yield strength can merely be caused by different crystallographic structures (here, different crystallographic structures refer to polycrystalline and single-crystalline structures).
materials science, multidisciplinary,physics, applied