PIXE Analysis of Silk
YC Liu,TY Yu,HY Yao,FJ Yang
DOI: https://doi.org/10.1002/(sici)1097-4628(19971010)66:2<405::aid-app21>3.0.co;2-v
IF: 3
1997-01-01
Journal of Applied Polymer Science
Abstract:The method of proton-induced X-ray emission (PIXE) was first utilized to analyze the elements in silk. Different kinds of silk from home and the wild were examined. The results show that every silk, besides C, H, O, and N, contains many types of elements such as Si, P. S, Ca, Mn, Fe, Cu, Zn, and Sr and different samples have different relative contents. © 1997 John Wiley & Sons, Inc. J Appl Polym Sci 66: 405–408, 1997