Development Of An Automatic Spectrophotometer

Py Wu,Pf Gu,Jf Tang
DOI: https://doi.org/10.1117/12.168212
1994-01-01
Abstract:An automatic spectrophotometer has been developed for spectral measurements of transmittance, reflectance and total optical losses of thin film specimens. The general system design and automation is described. The measured results of narrowband filters, ZnS films, mirrors, etc., are presented. In the visible region, the overall photometric accuracy is verified to be 0.1% and 0.2% for transmittance and reflectance; respectively. The wavelength scale is accurate to within 0.5 nm with a reproducibility of 0.1 nm.
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